Mass Production of a Trigger Data Serializer ASIC for the Upgrade of the Muon Spectrometer at the ATLAS Experiment
Jinhong Wang, Xiong Xiao, Reid Pinkham, Liang Guan, Wenhao Xu,, Zhongyao Qian, Prachi Arvind Atmasiddha, Jacob Searcy, John Chapman, Bing, Zhou, and Junjie Zhu

TL;DR
This paper presents the design, testing, and mass production of a custom ASIC for the ATLAS Muon Spectrometer upgrade, enabling reliable data serialization for improved detector performance.
Contribution
It introduces a novel automatic test platform for quality control of the TDS ASICs, ensuring high production standards for the detector upgrade.
Findings
Successful mass production of 6,000 ASICs
Effective testing platform ensures quality control
Enhanced detector data handling capabilities
Abstract
The Trigger Data Serializer (TDS) is a custom ASIC designed for the upgrade of the innermost station of the endcap ATLAS Muon Spectrometer. It is a mixed-signal chip with two working modes that can handle up to 128 detector channels. A total of 6,000 TDS ASICs have been produced for detector operation. This paper discusses a custom automatic test platform we developed to provide quality control of the TDS ASICs. We introduce the design, test procedures, and results obtained from this TDS testing platform.
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