Forescattered electron imaging of nanoparticles in a scanning electron microscopy

TL;DR

This paper investigates contrast inversion phenomena in forescattered electron imaging of nanoparticles using SEM, combining simulations and experiments to optimize imaging conditions and compare with TEM results.

Contribution

It introduces a comprehensive analysis of contrast inversion in forescattered electron imaging and proposes optimized imaging conditions for nano-scale microstructure investigation.

Findings

Contrast inversion depends on imaging conditions.

Optimized parameters enhance atomic number and diffraction contrast.

ARGUSTM system effectively characterizes nano-scale microstructures.

Abstract

In this study, we have used a Zr-Nb alloy containing well-defined nano-precipitates as a model material in which to study imaging contrast inversions (atomic number or diffraction contrast) observed with the forescattered electron imaging system, ARGUSTM, in a scanning electron microscope (SEM) when imaging a thin foil in a transmission geometry. The study is based on Monte Carlo simulations and analysis of micrographs experimentally acquired under different imaging conditions. Based on the results, imaging conditions that enhance atomic number or diffraction contrast have been proposed. Data acquired from the ARGUSTM imaging system in SEM has also been compared with results from standard transmission electron microscopy and scanning transmission electron microscopy imaging of the same material. These results demonstrate the capability of the ARGUSTM system to investigate microstructures in nano-scale materials.