# X-ray scattering from whispering gallery mirrors

## TL;DR

This paper explores a novel x-ray scattering method using whispering gallery effects for surface scanning, analyzing its capabilities through simulations and estimating detection limits based on surface roughness.

## Contribution

It introduces a new surface scanning technique based on whispering gallery x-ray scattering and evaluates its effectiveness via ray-tracing simulations.

## Key findings

- Dependence of x-ray beam output on RMS roughness
- Estimated minimum detectable imperfection height
- Simulation results demonstrating method capabilities

## Abstract

In this paper concave surface scanning method based on x-ray scattering in whispering gallery effect is considered. The capabilities of this method are studied based on ray-tracing computer simulation. The dependence of the output x-ray beam on the RMS roughness and minimum detectable imperfection height estimations were obtained.