Draw-down Parisian ruin for spectrally negative L\'{e}vy process
Wenyuan Wang, Xiaowen Zhou

TL;DR
This paper investigates the draw-down Parisian ruin problem for spectrally negative Lévy processes, providing new analytical tools and results for risk processes with dividend barriers and Parisian ruin times.
Contribution
It introduces the draw-down Parisian ruin time, solves the two-sided exit problem using excursion theory, and derives the potential measure for the killed process, advancing risk process analysis.
Findings
Derived explicit expressions for the draw-down Parisian ruin time.
Solved the two-sided exit problem using excursion theory.
Obtained new results for risk processes with dividend barriers.
Abstract
In this paper we study the draw-down related Parisian ruin problem for spectrally negative L\'{e}vy risk processes. We introduce the draw-down Parisian ruin time and solve the corresponding two-sided exit time via excursion theory. We also obtain an expression of the potential measure for the process killed at the draw-down Parisian time. As applications, new results are obtained for spectrally negative L\'{e}vy risk process with dividend barrier and Parisian ruin.
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Taxonomy
TopicsProbability and Risk Models · Insurance, Mortality, Demography, Risk Management · Stochastic processes and financial applications
