# Compact Error-Resilient Self-Assembly of Recursively Defined Patterns

**Authors:** Brad Shutters, Timothy P. Hartke Jr., Robert J. Sammelson

arXiv: 1904.02763 · 2019-04-09

## TL;DR

This paper presents a method for designing compact error-resilient self-assembly systems for recursively defined patterns, significantly reducing mismatch errors without increasing tile complexity or pattern scale.

## Contribution

It introduces a novel technique to create compact error-resilient systems for recursive patterns, maintaining tile count while reducing error rates to  under the independent error model.

## Key findings

- Reduces mismatch error rate to  without increasing tile types
- Applies to recursively defined patterns by Kautz and Lathrop
- Maintains the same number of tile types as error-prone systems

## Abstract

A limitation to molecular implementations of tile-based self-assembly systems is the high rate of mismatch errors which has been observed to be between 1% and 10%. Controlling the physical conditions of the system to reduce this intrinsic error rate $\epsilon$ prohibitively slows the growth rate of the system. This has motivated the development of techniques to redundantly encode information in the tiles of a system in such a way that the rate of mismatch errors in the final assembly is reduced even without a reduction in $\epsilon$. Winfree and Bekbolatov, and Chen and Goel, introduced such error-resilient systems that reduce the mismatch error rate to $\epsilon^k$ by replacing each tile in an error-prone system with a $k \times k$ block of tiles in the error-resilient system, but this increases the number of tile types used by a factor of $k^2$, and the scale of the pattern produced by a factor of $k$. Reif, Sahu and Yin, and Sahu and Reif, introduced compact error-resilient systems for the self-assembly of Boolean arrays that reduce the mismatch error rate to $\epsilon^2$ without increasing the scale of the pattern produced. In this paper, we give a technique to design compact error-resilient systems for the self-assembly of the recursively defined patterns introduced by Kautz and Lathrop. We show that our compact error-resilient systems reduce the mismatch error rate to $\epsilon^2$ by using the independent error model introduced by Sahu and Reif. Surprisingly, our error-resilient systems use the same number of tile types as the error-prone system from which they are constructed.

## Full text

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## Figures

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## References

15 references — full list in the complete paper: https://tomesphere.com/paper/1904.02763/full.md

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Source: https://tomesphere.com/paper/1904.02763