# High-energy coherent X-ray diffraction microscopy of polycrystal grains: first steps towards a multi-scale approach

## TL;DR

This paper demonstrates initial steps towards a multi-scale X-ray imaging method combining high-energy diffraction microscopy and coherent diffraction imaging to analyze polycrystalline materials at various length scales.

## Contribution

It introduces a novel integrated approach that combines HE-BCDI with ff-HEDM, enabling nanoscale resolution in polycrystal imaging.

## Key findings

- Successful HE-BCDI of sub-micron grains at 52 keV
- Integrated HE-BCDI with ff-HEDM for grain orientation analysis
- Foundation laid for extending HEDM resolution to the nanoscale

## Abstract

We present proof-of-concept imaging measurements of a polycrystalline material that integrate the elements of conventional high-energy X-ray diffraction microscopy with coherent diffraction imaging techniques, and that can enable in-situ strain-sensitive imaging of lattice structure in ensembles of deeply embedded crystals over five decades of length scale upon full realization. Such multi-scale imaging capabilities are critical to addressing important questions in a variety of research areas such as materials science and engineering, chemistry, and solid state physics. Towards this eventual goal, the following key aspects are demonstrated: 1) high-energy Bragg coherent diffraction imaging (HE-BCDI) of sub-micron-scale crystallites at 52 keV at current third-generation synchrotron light sources, 2) HE-BCDI performed in conjunction with far-field high-energy diffraction microscopy (ff-HEDM) on the grains of a polycrystalline sample in an smoothly integrated manner, and 3) the orientation information of an ensemble of grains obtained via ff-HEDM used to perform complementary HE-BCDI on multiple Bragg reflections of a single targeted grain. These steps lay the foundation for integration of HE-BCDI, which typically provides a spatial resolution tens of nanometers, into a broad suite of well-established HEDM methods, extending HEDM beyond the few-micrometer resolution bound and into the nanoscale, and positioning the approach to take full advantage of the orders-of-magnitude improvement of X-ray coherence expected at fourth generation light sources presently being built and commissioned worldwide.