Injecting Software Vulnerabilities with Voltage Glitching
Yifan Lu

TL;DR
This paper demonstrates how voltage glitching can induce timing violations in CMOS devices, enabling attackers to compromise security-hardened consumer devices by gaining code execution and extracting secure boot ROMs.
Contribution
It introduces a practical voltage glitching attack method to bypass security measures in real-world devices, showing its effectiveness against hardened systems.
Findings
Voltage glitching causes timing violations in CMOS.
Attack successfully extracts secure boot ROM.
Demonstrates vulnerability in security-hardened devices.
Abstract
We show how voltage glitching can cause timing violations in CMOS behavior. Then we attack a real, security hardened, consumer device to gain code execution and dump the secure boot ROM.
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsPhysical Unclonable Functions (PUFs) and Hardware Security · Security and Verification in Computing · Radiation Effects in Electronics
