# A symmetry-derived mechanism for atomic resolution imaging

## TL;DR

This paper presents a novel symmetry-based contrast mechanism for STEM that enhances atomic resolution imaging by leveraging local symmetry, providing sharper atomic columns and complementing existing imaging modes.

## Contribution

A new symmetry-derived contrast mechanism for STEM that improves atomic resolution imaging and is robust across various experimental conditions.

## Key findings

- Detects both light and heavy atomic columns
- Produces sharper atomic peaks than conventional methods
- Can be acquired simultaneously with existing imaging modes

## Abstract

We introduce a new image contrast mechanism for scanning transmission electron microscopy (STEM) that derives from the local symmetry within the specimen. For a given position of the electron probe on the specimen, the image intensity is determined by the degree of similarity between the exit electron intensity distribution and a chosen symmetry operation applied to that distribution. The contrast mechanism detects both light and heavy atomic columns and is robust with respect to specimen thickness, electron probe energy and defocus. Atomic columns appear as sharp peaks that can be significantly narrower than for STEM images using conventional disc and annular detectors. This fundamentally different contrast mechanism complements conventional imaging modes and can be acquired simultaneously with them, expanding the power of STEM for materials characterisation.