Development of a compact HAPG crystal Von Hamos X-ray spectrometer forextended and diffused sources
A. Scordo, C. Curceanu, M. Miliucci, F. Sirghi, J. Zmeskal

TL;DR
This paper presents a novel compact HAPG crystal Von Hamos X-ray spectrometer capable of high-resolution measurements from extended and diffused sources, expanding applications in physics, medicine, and industry.
Contribution
The development of a cost-effective, high-resolution X-ray spectrometer working with extended sources using a semi-Von Hamos configuration and HAPG crystals.
Findings
Achieved energy resolution at the eV level for 2 keV to tens of keV X-rays.
Successfully tested with various element lines including Fe, Cu, Ni, Zn, Mo, and Nb.
Demonstrated capability to measure extended and diffused sources with high precision.
Abstract
Bragg spectroscopy is one of the best established experimental methods for high energy resolution X-ray measurements; however, this technique is limited to the measurement of photons producedfrom well collimated (tens of microns) or point-like sources and becomes quite inefficient for photonscoming from extended and diffused sources. The possibility to perform simultaneous measurementsof several energies is strongly demanded when low rate signals are expected and single angular scansrequire long exposure times. A prototype of a high resolution and high precision X-ray spectrometerworking also with extended isotropic sources, has been developed by the VOXES collaboration atINFN Laboratories of Frascati, using Highly Annealed Pyrolitic Graphite (HAPG) crystals in a semi- Von Hamos configuration, in which the position detector is rotated with respect to thestandard Von Hamos one, to…
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Taxonomy
TopicsX-ray Spectroscopy and Fluorescence Analysis · Crystallography and Radiation Phenomena · Electron and X-Ray Spectroscopy Techniques
