Interfacial closure of contacting surfaces
F. Rieutord (NRS), C. Rauer (CEA-LETI), H. Moriceau (CEA-LETI)

TL;DR
This paper investigates the nanoscale gaps at contacting solid surfaces using high-energy X-ray reflectivity, establishing conditions for interface closure and demonstrating experimental validation with silicon bonding.
Contribution
It introduces a method to measure residual gaps at interfaces and identifies conditions for interface collapse due to attractive forces, validated through experiments.
Findings
Residual gaps can be measured with X-ray reflectivity.
A criterion for interface collapse due to van der Waals forces is established.
Experimental validation with silicon bonding confirms the collapse instability.
Abstract
Understanding the contact between solid surfaces is a long standing problem which has a strong impact on the physics of many processes such as adhesion, friction, lubrication and wear. Experimentally, the investigation of solid/solid interfaces remains challenging today, due to the lack of experimental techniques able to provide sub-nanometer scale information on interfaces buried between millimeters of materials. Yet, a strong interest exists improving the modeling of contact mechanics of materials in order to adjust their interface properties (e.g. thermal transport, friction). We show here that the essential features of the residual gap between contacting surfaces can be measured using high energy X-ray synchrotron reflectivity. The presence of this nano-gap is general to the contact of solids. In some special case however, it can be removed when attractive forces take over repulsive…
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