Microscopic validation of a variational model of epitaxially strained crystalline film
Leonard Kreutz, Paolo Piovano

TL;DR
This paper rigorously derives a continuum model for epitaxially strained crystalline films from atomistic interactions using $ ext{Gamma}$-convergence, validating macroscopic models through microscopic analysis.
Contribution
It provides a discrete-to-continuum analysis of crystalline films, justifying continuum models from atomistic interactions with rigorous mathematical proofs.
Findings
Established a discrete rigidity estimate for small lattice mismatches.
Proved the limiting deformation is a single rigid motion.
Derived continuum energy models consistent with existing literature.
Abstract
A discrete-to-continuum analysis for free-boundary problems related to crystalline films deposited on substrates is performed by -convergence. The discrete model here introduced is characterized by an energy with two contributions, the surface and the elastic-bulk energy, and it is formally justified starting from atomistic interactions. The surface energy counts missing bonds at the film and substrate boundaries, while the elastic energy models the fact that for film atoms there is a preferred interatomic distance different from the preferred interatomic distance for substrate atoms. In the regime of small mismatches between the film and the substrate optimal lattices, a discrete rigidity estimate is established by regrouping the elastic energy in triangular-cell energies and by locally applying rigidity estimates from the literature. This is crucial to establish…
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Taxonomy
TopicsFluid Dynamics and Thin Films · Solidification and crystal growth phenomena · Force Microscopy Techniques and Applications
