Fermi-level depinning in metal-2D multilayered semiconductor junctions
Qian Wang, Yangfan Shao, Penglai Gong, and Xingqiang Shi

TL;DR
This paper investigates how the Fermi-level pinning in metal-2D semiconductor junctions depends on the number of layers, revealing a depinning mechanism that influences contact properties and band alignment, with implications for electronics and optoelectronics.
Contribution
The authors develop an extended Fermi-level pinning theory for multilayered 2D semiconductor junctions, explaining layer-dependent depinning and its effects on device characteristics.
Findings
Pinning strength varies with layer number in 2D semiconductor junctions.
Depinning occurs between layers, weakening overall pinning.
Layer-dependent depinning enables p-type contacts and type II band alignment.
Abstract
Thicknesses-dependent performance of metal-two-dimensional (2D) semiconductor junctions (MSJ) in electronics/optoelectronics have attracted increasing attention, but till present, people have little knowledge about the micro-mechanism of the thicknesses (or layer-number) dependence. Here, by first-principles calculations based on density functional theory, we show that the Fermi-level pinning (FLP) factor of MSJ depends sensitively on the layer-number of few-layer 2D semiconductors, and, an extended FLP theory is proposed for metal-2D multilayered semiconductor junctions (MmSJ). Taking multilayered MoS2 as a typical example for van der Waals (vdW) semiconductor in MmSJ, the extended FLP theory has the following character: strong pinning right at the metal-1st-layer semiconductor interface while depinning occurs between MoS2 layers. This depinning effect between vdW layers has several…
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Taxonomy
Topics2D Materials and Applications · Graphene research and applications · Surface and Thin Film Phenomena
