# The atomic lensing model: new opportunities for atom-by-atom metrology of heterogeneous nanomaterials

## TL;DR

The atomic lensing model offers a novel approach for atom-by-atom analysis of nanomaterials, enabling improved detection of compositional differences through electron diffraction simulations.

## Contribution

This paper validates the atomic lensing model through image simulations, demonstrating its reliability and potential for enhanced nanomaterial metrology.

## Key findings

- Model accurately describes dynamical diffraction at the atomic level
- Reliable in annular dark field imaging for columns with dozens of atoms
- Enables detection of subtle compositional differences

## Abstract

The atomic lensing model has been proposed as a promising method facilitating atom-counting in heterogeneous nanocrystals [KHW van den Bos et. al, Phys. Rev. Lett. 116 (2016) 246101] Here, image simulations will validate the model, which describes dynamical diffraction as a superposition of individual atoms focussing the incident electrons. It will be demonstrated that the model is reliable in the annular dark field regime for crystals having columns containing dozens of atoms. By using the principles of statistical detection theory, it will be shown that this model gives new opportunities for detecting compositional differences.