DeepBillboard: Systematic Physical-World Testing of Autonomous Driving Systems
Husheng Zhou, Wei Li, Yuankun Zhu, Yuqun Zhang, Bei Yu, Lingming, Zhang, Cong Liu

TL;DR
DeepBillboard introduces a novel physical-world testing method for autonomous driving that creates resilient adversarial billboards capable of causing steering errors under various real-world conditions.
Contribution
This paper presents the first systematic approach to generate physical adversarial billboards that impact autonomous vehicle steering decisions in real-world scenarios.
Findings
Effective across different steering models and scenes
Robust against changing viewing angles, distances, and lighting
Successful in physical-world driving tests under various weather conditions
Abstract
Deep Neural Networks (DNNs) have been widely applied in many autonomous systems such as autonomous driving. Recently, DNN testing has been intensively studied to automatically generate adversarial examples, which inject small-magnitude perturbations into inputs to test DNNs under extreme situations. While existing testing techniques prove to be effective, they mostly focus on generating digital adversarial perturbations (particularly for autonomous driving), e.g., changing image pixels, which may never happen in physical world. There is a critical missing piece in the literature on autonomous driving testing: understanding and exploiting both digital and physical adversarial perturbation generation for impacting steering decisions. In this paper, we present DeepBillboard, a systematic physical-world testing approach targeting at a common and practical driving scenario: drive-by…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsAdversarial Robustness in Machine Learning · Anomaly Detection Techniques and Applications · Integrated Circuits and Semiconductor Failure Analysis
