Multiple intrabeam scattering in X-Y coupled focusing systems

TL;DR

This paper introduces an analytical approach to compute emittance growth caused by intra-beam scattering in coupled X-Y systems of circular accelerators, applicable to various beam types.

Contribution

It develops a new analytical method based on Landau collision integral and Mais-Ripken parametrization for coupled betatron motion to estimate emittance growth rates.

Findings

Provides formulas for emittance growth rates in coupled systems.

Applicable to both bunched and continuous beams.

Based on calculations with Gaussian distributions.

Abstract

This paper describes an analytical method to calculate the emittance growth rates due to intra-beam scattering in a circular accelerator with arbitrary x-y coupling. The underlying theory is based on the Landau collision integral and the extended Mais-Ripken parametrization of a coupled betatron motion. The presented results are based on calculations of average emittance growth rates for an initially Gaussian distribution. They are applicable to both bunched and continuous beams.