# Robust Exceptional Points in Disordered Systems

**Authors:** Cem Yuce, Hamidreza Ramezani

arXiv: 1812.02218 · 2018-12-07

## TL;DR

This paper introduces a theory for topologically robust exceptional points (EPs) in disordered systems, proposing a method to achieve EPs that are insensitive to disorder, with potential applications in sensors and robust devices.

## Contribution

The authors develop a new approach to realize disorder-robust EPs using asymmetric coupling, extending the concept of topological robustness to exceptional points in disordered systems.

## Key findings

- Disordered systems typically lack EPs at the same parameters as ordered systems.
- Incorporating asymmetric coupling can create robust, extended EPs insensitive to disorder.
- Proposed photonic system can experimentally realize the robust EPs.

## Abstract

We construct a theory to introduce the concept of topologically robust exceptional points (EP). Starting from an ordered system with $N$ elements, we find the necessary condition to have the highest order exceptional point, namely $N^\text{th}$ order EP. Using symmetry considerations, we show an EP associated with an order system is very sensitive to the disorder. Specifically, if the EP associated with the ordered system occurs at the fixed degree of non-Hermiticity $\gamma_{EP}$, the disordered system will not have EP at the same $\gamma_{PT}$ which puts an obstacle in front of the observation and applications of EPs. To overcome this challenge, by incorporating an asymmetric coupling we propose a disordered system that has a robust EP which is extended all over the space. While our approach can be easily realized in electronic circuits and acoustics, we propose a simple experimentally feasible photonic system to realize our robust EP. Our results will open a new direction to search for topologically robust extended states (as opposed to topological localized states) and find considerable applications in direct observation of EPs, realizing topological sensors and designing robust devices for metrology.

## Full text

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## Figures

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## References

60 references — full list in the complete paper: https://tomesphere.com/paper/1812.02218/full.md

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Source: https://tomesphere.com/paper/1812.02218