Imaging at the mesoscale (LEEM, PEEM)

TL;DR

This paper reviews cathode lens electron microscopy techniques, specifically LEEM and PEEM, highlighting their principles, capabilities, applications in various scientific fields, and future development prospects.

Contribution

It provides a comprehensive overview of LEEM and PEEM instruments, including their operating principles, contrast mechanisms, modes, and recent advancements.

Findings

LEEM and PEEM enable detailed chemical, magnetic, and structural imaging at the mesoscale.

These techniques are widely used in nanotechnology, material science, and related fields.

Future developments aim to enhance performance and expand applications.

Abstract

*To be published in Springer Handbook of Surface Science (Springer Verlag) [Preprint]* The capability to display images containing chemical, magnetic and structural information and to perform spectroscopy and diffraction from a {\mu}m-sized area makes cathode lens electron microscopy one of the most used and reliable techniques to analyze surfaces at the mesoscale. Thanks to its versatility, LEEM/PEEM systems are currently employed to study model systems in the fields of nanotechnology, nanomagnetism, material science, catalysis, energy storage, thin films and 2D materials. In the following chapter, we will present a brief but complete review of this class of instruments. After an historical digression in the introducing section, we will show first the basic operating principles of a simple setup and then the elements that can be added to improve the performances. Later, two sections will be dedicated to LEEM and PEEM respectively. In both cases, a theoretical discussion on the contrast mechanisms will prelude to a showcase of the operating modes of the instrument, with clear examples that will show the best performances available nowadays. Finally, a brief discussion about the future developments of cathode lens electron microscopy will close the chapter.