Three-dimensional force-field microscopy with optically levitated microspheres

TL;DR

This paper demonstrates a three-dimensional force-field microscopy technique using optically levitated microspheres, achieving high sensitivity and spatial resolution for mapping electric fields near microfabricated structures.

Contribution

The authors introduce a novel 3D force-field imaging method with optically levitated microspheres, combining interferometric imaging and force measurement in vacuum.

Findings

Achieved force sensitivity of (2.5 ± 1.0) × 10^{-17} N/√Hz in all three axes.

Successfully mapped the vector force field over a volume of approximately 10^6 μm^3.

Demonstrated the capability to measure forces close to microfabricated surfaces with high precision.

Abstract

We report on the use of 4.7-$\mu$m-diameter, optically levitated, charged microspheres to image the three-dimensional force field produced by charge distributions on an Au-coated, microfabricated Si beam in vacuum. An upward-propagating, single-beam optical trap, combined with an interferometric imaging technique, provides optimal access to the microspheres for microscopy. In this demonstration, the Au-coated surface of the Si beam can be brought as close as ${\sim}10~\mu$m from the center of the microsphere while forces are simultaneously measured along all three orthogonal axes, fully mapping the vector force field over a total volume of ${\sim}10^6~\mu$m$^3$. We report a force sensitivity of $(2.5 \pm 1.0) \times 10^{-17}~{\rm N / \sqrt{Hz}}$, in each of the three degrees of freedom, with a linear response to up to ${\sim}10^{-13}~{\rm N}$. While we discuss the case of mapping static electric fields using charged microspheres, it is expected that the technique can be extended to other force fields, using microspheres with different properties.