Charge transfer and tunable built-in electric fields across semiconductor-crystalline oxide interfaces
Zheng Hui Lim, Nicholas F. Quackenbush, Aubrey Penn, Matthew Chrysler,, Mark Bowden, Zihua Zhu, James M. Ablett, Tien-lin Lee, James M. LeBeau,, Joseph C. Woicik, Peter V. Sushko, Scott A. Chambers, Joseph H. Ngai

TL;DR
This study investigates the electrical properties and built-in electric fields at epitaxial SrNbxTi1-xO3-{ extdelta}/Si heterojunctions, revealing charge transfer phenomena and tunable fields that could enable new device functionalities.
Contribution
It provides the first detailed analysis of charge transfer and built-in electric fields in semiconductor-crystalline oxide heterojunctions using electrical transport and X-ray spectroscopy.
Findings
Observation of non-monotonic resistance anomaly near room temperature
Detection of a sign crossover in Hall resistance indicating hole gas formation
Mapping of band bending and built-in fields across the heterojunction
Abstract
Built-in electric fields across heterojunctions between semiconducting materials underpin the functionality of modern device technologies. Heterojunctions between semiconductors and epitaxially grown crystalline oxides provide a rich setting in which built-in fields can be explored. Here, we present an electrical transport and hard X-ray photoelectron spectroscopy study of epitaxial SrNbxTi1-xO3-{\delta} / Si heterojunctions. A non-monotonic anomaly in the sheet resistance is observed near room temperature, which is accompanied by a crossover in sign of the Hall resistance. The crossover is consistent with the formation of a hole gas in the Si and the presence of a built-in field. Hard X-ray photoelectron spectroscopy measurements reveal pronounced asymmetric features in both the SrNbxTi1-xO3-{\delta} and Si core-level spectra that we show arise from built-in fields. The extended probe…
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Taxonomy
TopicsElectronic and Structural Properties of Oxides · Semiconductor materials and devices · Ferroelectric and Piezoelectric Materials
