Ultrafast Studies of Hot-Hole Dynamics in Au/p-GaN Heterostructures
Giulia Tagliabue, Joseph S. DuChene, Mohamed Abdellah, Adela Habib,, Yocefu Hattori, Kaibo Zheng, Sophie E. Canton, David J. Gosztola, Wen-Hui, Cheng, Ravishankar Sundararaman, Jacinto Sa, and Harry A. Atwater

TL;DR
This study reveals that hot holes in Au/p-GaN heterostructures are injected within 200 fs, influencing hot-electron dynamics and offering new insights for hot-carrier optoelectronic applications.
Contribution
It provides the first ultrafast measurement of hot-hole injection in metal-semiconductor heterostructures and links hot-hole dynamics to hot-electron relaxation processes.
Findings
Hot-hole injection occurs within 200 fs.
Hot-hole removal affects hot-electron thermalization.
Hot-hole injection modifies hot-electron relaxation dynamics.
Abstract
Harvesting non-equilibrium hot carriers from photo-excited metal nanoparticles has enabled plasmon-driven photochemical transformations and tunable photodetection with resonant nanoantennas. Despite numerous studies on the ultrafast dynamics of hot electrons, to date, the temporal evolution of hot holes in metal-semiconductor heterostructures remains unknown. An improved understanding of the carrier dynamics in hot-hole-driven systems is needed to help expand the scope of hot-carrier optoelectronics beyond hot-electron-based devices. Here, using ultrafast transient absorption spectroscopy, we show that plasmon-induced hot-hole injection from gold (Au) nanoparticles into the valence band of p-type gallium nitride (p-GaN) occurs within 200 fs, placing hot-hole transfer on a similar timescale as hot-electron transfer. We further observed that the removal of hot holes from below the Au…
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