Study of domain switching using piezoresponse force microscopy in Ca0.4Sr0.6Bi4Ti4O15 thin film for electromechanical applications
Supratim Mitra, Satakshi Gupta, Aneesh M. Joseph, Umesh Kumar Dwivedi

TL;DR
This study synthesizes and characterizes Ca0.4Sr0.6Bi4Ti4O15 thin films, demonstrating effective domain switching and high piezoelectric response, indicating promising applications in electromechanical devices.
Contribution
It reports the successful synthesis and optimization of CSBT thin films with high piezoelectric response using pulsed laser deposition.
Findings
High-quality, c-axis oriented films with 330-400 nm thickness.
Complete domain reversal observed via PFM.
Effective d33* value of approximately 120 pm/V.
Abstract
An attempt has been made to synthesize (Ca0.4Sr0.6)Bi4Ti4O15(CSBT) thin film using pulsed laser deposition (PLD) and successfully optimized the deposition conditions. A good quality film with the desired phase is obtained at a substrate temperature of 650 oC based on phase, composition and morphology studies. Highly c-axis oriented films with average thickness 330-400 nm and an average grain size 40-65 nm has been found. Piezoresponse force microscopy (PFM) showed a complete domain reversal using switching spectroscopy. A comparatively high effective d33* value as ~120 pm/V has been achived. The results suggest that CSBT has a great potential in electromechanical applications.
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