Eliminating the effect of acoustic noise on cantilever spring constant calibration

TL;DR

This paper introduces a noise-resistant calibration method for atomic force microscopy cantilever spring constants, improving accuracy by actively measuring resonance parameters unaffected by ambient acoustic noise.

Contribution

A new calibration technique that actively drives the cantilever to measure resonance frequency and quality factor, eliminating the influence of acoustic noise.

Findings

Calibration results are consistent regardless of ambient noise conditions.

The method is rapid and does not require additional hardware.

It reduces variability in spring constant measurements across different users and microscopes.

Abstract

A common use for atomic force microscopy is to quantify local forces through tip-sample interactions between the probe tip and a sample surface. The accuracy of these measurements depends on the accuracy to which the cantilever spring constant is known. Recent work has demonstrated that the measured spring constant of a cantilever can vary up to a factor of two, even for the exact same cantilever measured by different users on different microscopes. Here we demonstrate that a standard method for calibrating the spring constant (using the oscillations due to thermal energy) is susceptible to ambient noise, which can alter the result significantly. We demonstrate a new step-by-step method to measure the spring constant by actively driving the cantilever to measure the resonance frequency and quality factor, giving results that are unaffected by acoustic noise. Our method can be performed rapidly on any atomic force microscope without any expensive additional hardware.