Proposal for a three-dimensional magnetic measurement method with nanometer-scale depth resolution

TL;DR

This paper introduces a novel magnetic measurement technique that combines depth sectioning with electron magnetic circular dichroism in STEM, achieving nanometer-scale depth resolution and atomic lateral resolution.

Contribution

It proposes a new method leveraging electron vortex beams in STEM for high-resolution magnetic measurements with sub-2 nm depth resolution.

Findings

Achieves atomic lateral resolution in magnetic measurements.

Attains depth resolution below 2 nm.

Utilizes electron vortex beams with large convergence angles.

Abstract

We propose a magnetic measurement method based on combining depth sectioning and electron magnetic circular dichroism in scanning transmission electron microscopy. Electron vortex beams with large convergence angles, as those achievable in current state-of-the-art aberration correctors, could produce atomic lateral resolution and depth resolution below 2~nm.