Observation of the angular distribution of a x-ray characteristic emission through a periodic multilayer

TL;DR

This study demonstrates that the angular distribution of characteristic x-ray emission through a multilayer can be used as a spectroscopic tool, enabling element identification without mechanical adjustments, using various ionizing sources.

Contribution

It introduces a novel method to analyze x-ray emission angular distribution through multilayers for spectroscopic applications.

Findings

Clear dip observed at specific angles for emitting elements

Device functions as a spectrometer without mechanical displacement

Applicable with different ionizing sources such as electrons, x-rays, ions

Abstract

We present the observation of the angular distribution of a characteristic x-ray emission through a periodic multilayer. The emission coming from the substrate on which the multilayer is deposited is used for this purpose. It is generated upon proton irradiation through the multilayer and detected with an energy sensitive CCD camera. The observed distribution in the low detection angle range presents a clear dip at a position characteristic of the emitting element. Thus, such a device can be envisaged as a spectrometer without mechanical displacement and using various ionizing sources (electrons, x-rays, ions), their incident direction being irrelevant.