Optical and RF Metrology for 5G
David A. Humphreys, Irshaad Fatadin, Mark Bieler, Paul Struszewski,, Martin Hudlicka
TL;DR
This paper reviews optical and RF metrology techniques essential for developing 5G communication systems, focusing on device measurement, oscilloscope impairments, and system resolution improvements.
Contribution
It provides an overview of current optical and electrical metrology methods supporting 5G system development and discusses challenges and advancements in measurement accuracy.
Findings
Device measurement techniques for 5G RF systems
Impact of oscilloscope impairments on measurement accuracy
Strategies for improving system resolution
Abstract
Specification standards will soon be available for 5G mobile RF communications. What optical and electrical metrology is needed or available to support the development of the supporting optical communication systems? Device measurement, digital oscilloscope impairments and improving system resolution are discussed.
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