Near--K-edge double and triple detachment of the F- negative ion: observation of direct two-electron ejection by a single photon
A. M\"uller, A. Borovik Jr., S. Bari, T. Buhr, K. Holste, M. Martins,, A. Perry-Sa{\ss}mannshausen, R. A. Phaneuf, S. Reinwardt, S. Ricz, K., Schubert, and S. Schippers

TL;DR
This paper investigates the double and triple detachment of F- ions by a single photon, providing experimental evidence for direct two-electron ejection and measuring absolute cross sections in the 660-1000 eV range.
Contribution
It presents the first experimental evidence of direct two-electron ejection from F- ions and measures absolute cross sections for this process.
Findings
Direct photo-double-detachment dominates the reaction channel.
Absolute cross sections for (1s+2p) electron removal were determined.
Evidence supports the role of a subsequent single-Auger process.
Abstract
Double and triple detachment of the F-(1s2 2s2 2p6) negative ion by a single photon have been investigated in the photon energy range 660 to 1000 eV. The experimental data provide unambiguous evidence for the dominant role of direct photo-double-detachment with a subsequent single-Auger process in the reaction channel leading to F2+ product ions. Absolute cross sections were determined for the direct removal of a (1s+2p) pair of electrons from F- by the absorption of a single photon.
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