Fast and direct visualization of piezo-generated charges at the nanoscale using direct piezoelectric force microscopy

TL;DR

This paper clarifies the proper electronic conditions for measuring piezo-generated charges at the nanoscale using DPFM, revealing that previous measurements overestimated charge due to incorrect amplifier assumptions, thus refining the technique's accuracy.

Contribution

It identifies the correct operational conditions for DPFM measurements, correcting prior overestimations of charge and establishing DPFM as a reliable nanoscale ferroelectric characterization method.

Findings

Previous charge measurements were overestimated due to amplifier artifacts.

Proper measurement conditions significantly reduce the observed charge.

DPFM can be employed as a fast, accurate nanoscale ferroelectric characterization tool.

Abstract

The denominated surface charge scraping mechanism was discovered in 2014 by using a new Atomic Force Microscopy (AFM) based mode called Charge Gradient Microscopy. The measurements to probe such mechanism are achieved with the use of a current-to-voltage converter: a transimpedance amplifier (TIA). However, the use of an incorrect approximation, named Gain BandWidth Product (GBWP) to calculate TIAs BandWidth (BW) could mislead to an incorrect data interpretation. By measuring at higher frequencies than permitted, the amplifier is used as a current-to-voltage converter, in conditions where it behaves as a charge-to-voltage converter. In this manuscript, we report the specific conditions in which the transfer function of the same electronic circuit topology is valid, while we spot both ringing and unstable amplifiers artifacts in the published data. We finally perform physical measurements in similar conditions as reported, but fully respecting the BandWidth (BW) of the system. We find that the charge collected is way below the values reported in such publication, diminishing or even nullifying the impact of a possible charge scrapping mechanism. These findings pave the way to employ Direct Piezoelectric Force Microscopy (DPFM) as a fast ferroelectric nanoscale characterization tool.