3D-Printed Optics for Wafer-Scale Probing

TL;DR

This paper presents a novel approach using 3D-printed optical probes to enable efficient wafer-scale testing of photonic integrated circuits, improving coupling to nanophotonic waveguides.

Contribution

Introduction of 3D-printed optical probes for high-throughput wafer-level testing of photonic circuits, demonstrating broad applicability across platforms.

Findings

Effective coupling of light to nanophotonic waveguides achieved.

Probes are compatible with various integration platforms.

Technique enhances testing efficiency at wafer scale.

Abstract

Mass production of photonic integrated circuits requires high-throughput wafer-level testing. We demonstrate that optical probes equipped with 3D-printed elements allow for efficient coupling of light to etched facets of nanophotonic waveguides. The technique is widely applicable to different integration platforms.