Parametric Topology Optimization with Multi-Resolution Finite Element Models
Vahid Keshavarzzadeh, Robert M. Kirby, Akil Narayan

TL;DR
This paper introduces a bi-fidelity finite element framework for efficient topology optimization under uncertainty, significantly reducing computational costs while maintaining high accuracy in design and stress analysis.
Contribution
The authors develop a bi-fidelity approach combining coarse and fine mesh models for topology optimization, providing error bounds and demonstrating efficiency on benchmark problems.
Findings
Significant reduction in computational cost for topology optimization under manufacturing variability.
Almost identical designs obtained with multi-resolution models compared to high-resolution only.
Accurate parametric stress analysis via bi-fidelity FE approximation validated against Monte Carlo simulations.
Abstract
We present a methodical procedure for topology optimization under uncertainty with multi-resolution finite element models. We use our framework in a bi-fidelity setting where a coarse and a fine mesh corresponding to low- and high-resolution models are available. The inexpensive low-resolution model is used to explore the parameter space and approximate the parameterized high-resolution model and its sensitivity where parameters are considered in both structural load and stiffness. We provide error bounds for bi-fidelity finite element (FE) approximations and their sensitivities and conduct numerical studies to verify these theoretical estimates. We demonstrate our approach on benchmark compliance minimization problems where we show significant reduction in computational cost for expensive problems such as topology optimization under manufacturing variability while generating almost…
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