Surface structures of ZrO$_2$ films on Rh(111): From two layers to bulk termination
Peter Lackner, Zhiyu Zou, Sabrina Mayr, Joong-Il Jake Choi, Ulrike, Diebold, Michael Schmid

TL;DR
This study investigates the surface structures of zirconia films on Rh(111) substrates, revealing phase transformations and stabilization mechanisms relevant for surface science and electrolyte applications.
Contribution
It provides detailed structural analysis of thin ZrO₂ films on Rh(111), highlighting phase stability, transformation conditions, and the films' suitability as model systems.
Findings
Thin films show substrate influence for 2-4 ML thickness.
Tetragonal phase stabilized up to 730°C, transforming to monoclinic at 850°C.
Films are stable, homogeneous, and suitable for surface science studies.
Abstract
We have studied zirconia films on a Rh(111) substrate with thicknesses in the range of 2-10 monolayers (ML) using scanning tunneling microscopy (STM) and low-energy electron diffraction (LEED). Zirconia was deposited using a UHV-compatible sputter source, resulting in layer-by-layer growth and good uniformity of the films. For thicknesses of 2-4 ML, a layer-dependent influence of the substrate on the structure of the thin films is observed. Beyond this thickness, films show a (2 1) or a distorted (2 2) surface structure with respect to cubic ZrO(111); these structures correspond to tetragonal and monoclinic zirconia, respectively. The tetragonal phase occurs for annealing temperatures of up to 730 {\deg}C; transformation to the thermodynamically stable monoclinic phase occurs after annealing at 850 {\deg}C or above. High-temperature annealing also breaks up the…
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