Protected 0-pi states in SIsFS junctions for Josephson memory and logic
S.V. Bakurskiy, N.V. Klenov, I.I. Soloviev, N.G. Pugach, M.Yu., Kupriyanov, A.A. Golubov

TL;DR
This paper investigates the current-phase relations in SIsFS Josephson junctions, revealing how barrier transparency and s-layer thickness influence 0 and π states, with implications for superconducting memory and logic devices.
Contribution
It uncovers how the CPR shape transforms with barrier transparency and s-layer thickness, identifying conditions for stable 0 and π states useful for memory and logic applications.
Findings
CPR consists of two independent branches for 0 and π states.
Decreasing s-layer thickness causes CPR shape transformation.
Difference in critical currents of branches can reach 10%.
Abstract
We study the peculiarities in current-phase relations (CPR) of the SIsFS junction in the region of to transition. These CPR consist of two independent branches corresponding to and states of the contact. We have found that depending on the transparency of the SIs tunnel barrier the decrease of the s-layer thickness leads to transformation of the CPR shape going in the two possible ways: either one of the branches exists only in discrete intervals of the phase difference or both branches are sinusoidal but differ in the magnitude of their critical currents. We demonstrate that the difference can be as large as under maintaining superconductivity in the s layer. An applicability of these phenomena for memory and logic application is discussed.
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