Fast and accurate functionalization of opaque conductive samples with single nano particles

TL;DR

This paper introduces a precise, non-contact method for positioning single quantum emitters on opaque conductive surfaces using electrostatic forces and AFM, enabling improved fabrication of quantum photonic devices.

Contribution

The authors develop a novel electrostatic force-based technique for accurately placing nano crystals on non-transparent conductive samples without tip contact.

Findings

Achieved nanometer-scale placement accuracy of quantum emitters.

Demonstrated successful transfer of diamond nano crystals to silver antennas.

Provided a reliable method for assembling quantum photonic components.

Abstract

Single quantum emitters coupled to different plasmonic and photonic structures are key elements for integrated quantum technologies. In order to fully exploit these elements, e.g. for quantum enhanced sensors or quantum repeaters, a reliable fabrication method as enabling technology is crucial. In this work, we present a method that allows for positioning of individual nano crystals containing single quantum light sources on non-transparent conductive samples with sub-micrometer precision. We induce long-range electrostatic forces between an atomic force microscope (AFM) tip, which carries a nano particle, and the target surface. This allows for mapping of the target area in non contact mode. Then, the placement site can be identified with high accuracy without any tip approach, eliminating the risk of a particle loss. We demonstrate the strength of the method by transferring a diamond nano crystal containing a single nitrogen-vacancy defect to the center of a micrometer-sized silver bullseye antenna with nanometer resolution. Our approach provides a simple and reliable assembling technology for positioning single nano objects on opaque substrates with high reproducibility and precision.