Band structure engineering and reconstruction in electric circuit networks
Tobias Helbig, Tobias Hofmann, Ching Hua Lee, Ronny Thomale, Stefan, Imhof, Laurens W. Molenkamp, Tobias Kiessling

TL;DR
This paper presents a method to design and analyze band structures in electric circuit networks, enabling the exploration of topological phases and edge modes in synthetic materials.
Contribution
It introduces a Laplacian formalism for synthetic matter in circuits, allowing for the engineering and measurement of complex band structures and topological transitions.
Findings
Demonstrated Dirac cone admittance dispersion in a honeycomb circuit
Observed flat band edge modes at circuit terminations
Measured a topological phase transition in a topolectrical circuit
Abstract
We develop an approach to design, engineer, and measure band structures in a synthetic crystal composed of electric circuit elements. Starting from the nodal analysis of a circuit lattice in terms of currents and voltages, our Laplacian formalism for synthetic matter allows us to investigate arbitrary tight-binding models in terms of wave number resolved Laplacian eigenmodes, yielding an admittance band structure of the circuit. For illustration, we model and measure a honeycomb circuit featuring a Dirac cone admittance bulk dispersion as well as flat band admittance edge modes at its bearded and zigzag terminations. We further employ our circuit band analysis to measure a topological phase transition in the topolectrical Su-Schrieffer-Heeger circuit.
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