Energy response of X-rays under high flux conditions using a thin APD for the energy range of 6-33 keV

TL;DR

This study demonstrates a high-rate X-ray energy measurement method using a thin silicon avalanche photodiode with a dedicated amplitude-to-time converter, effectively capturing energy spectra from 6 to 33 keV.

Contribution

The paper introduces a novel high-rate energy measurement technique with a dedicated converter and systematic analysis of energy response for X-rays in the 6-33 keV range.

Findings

Clear energy peaks observed in spectra

Peak fraction decreases with increasing photon energy

Monte Carlo simulation explains energy deposit distribution

Abstract

This paper reports on the demonstration of a high-rate energy measurement technique using a thin depletion layer silicon avalanche photodiode (Si-APD). A dedicated amplitude-to-time converter is developed to realize simultaneous energy and timing measurement in a high rate condition. The energy response of the system is systematically studied by using monochromatic X-ray beam with an incident energy ranging from 6 to 33 keV. The obtained energy spectra contain clear peaks and tail distributions. The peak fraction monotonously decreases as the incident photon energy increases. This phenomenon can be explained by considering the distribution of the energy deposit in silicon, which is investigated by using a Monte Carlo simulation.