Demonstrating the potential of Accurate Absolute Cross-grain Stress and Orientation correlation using Electron Backscatter Diffraction

TL;DR

This paper introduces a novel high-angular-resolution EBSD technique for precise absolute stress and orientation measurements in polycrystalline materials without relying on simulated patterns, demonstrating high accuracy in a virtual case study.

Contribution

It presents a new method for absolute stress and orientation measurement using EBSD without simulated pattern references, leveraging pattern center correlation and crystal symmetry.

Findings

Errors below 20 MPa in stress measurement

Orientation errors below 7e-5 radians

Pattern center accuracy within 0.06 pixels

Abstract

We report a first exploration of High-angular-Resolution Electron Backscatter Diffraction, without using simulated Electron Backscatter Diffraction patterns as a reference, for absolute stress and orientation measurements in polycrystalline materials. By co-correlating the pattern center and fully exploiting crystal symmetry and plane-stress, simultaneous correlation of all overlapping regions of interest in multiple direct-electron-detector, energy-filtered Electron Backscatter Diffraction patterns is achieved. The potential for highly accurate measurement of absolute stress, crystal orientation and pattern center is demonstrated on a virtual polycrystalline case-study, showing errors respectively below 20 MPa (or 1e-4 in strain), 7e-5 rad and 0.06 pixels.