Anode current saturation of ALD-coated Planacon MCP-PMTs
E.V. Antamanova, I.G. Bearden, E.J. Garcia-Solis, A.V. Harton, V.A., Kaplin, T.L. Karavicheva, J.L. Klay, Yu.A. Melikyan, D.V. Serebryakov, M., Slupecki, W.H. Trzaska

TL;DR
This study compares ALD-coated and non-ALD Planacon MCP-PMTs, revealing unexpectedly low current saturation and high gain recovery times in ALD-coated sensors, indicating potential technological challenges for ALD coating processes.
Contribution
The paper provides the first comparative analysis highlighting significant performance issues in ALD-coated MCP-PMTs, suggesting possible side-effects of the ALD process affecting device performance.
Findings
ALD-coated MCP-PMTs have ~100x lower current saturation than expected.
ALD-coated sensors exhibit gain recovery times over 10^7 times longer than expected.
Non-ALD MCP-PMTs show excellent performance, contrasting with ALD-coated counterparts.
Abstract
We have measured and compared the characteristics of ALD-coated Planacon MCP-PMTs (XP85112/A1-Q-L) with their non-ALD counterparts (XP85012/A1-Q). While the later show excellent performance, the ALD-coated sensors have surprisingly low current saturation levels (~two orders of magnitude lower than expected) and extremely high gain recovery time (more than 7 orders of magnitude higher than expected). We suspect that these problems might be caused by the unexpected side-effects of the ALD process. To make a definite conclusion, more samples need to be tested, preferably from different production runs. If our observation were confirmed, it would mean a serious technological setback for ALD-coated MCP-PMTs.
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