Convergent beam electron holography for analysis of van der Waals heterostructures
Tatiana Latychevskaia, Colin Robert Woods, Yi Bo Wang, Matthew, Holwill, Eric Prestat, Sarah J. Haigh, Kostya S. Novoselov

TL;DR
This paper introduces a convergent beam electron holography technique that enables atomic-precision imaging of the stacking order and defects in van der Waals heterostructures, facilitating detailed 3D structural analysis from a single image.
Contribution
The paper presents a novel holographic method for analyzing the 3D structure and defects in van der Waals heterostructures with atomic resolution, which was not previously achievable.
Findings
Reconstructs relative rotation, stretching, and corrugation of layers.
Extracts quantitative 3D defect information from a single image.
Provides qualitative defect analysis from diffraction patterns.
Abstract
Van der Waals heterostructures, which explore the synergetic properties of two-dimensional (2D) materials when assembled into three-dimensional stacks, have already brought to life a number of exciting new phenomena and novel electronic devices. Still, the interaction between the layers in such assembly, possible surface reconstruction, intrinsic and extrinsic defects are very difficult to characterise by any method, because of the single-atomic nature of the crystals involved. Here we present a convergent beam electron holographic technique which allows imaging of the stacking order in such heterostructures. Based on the interference of electron waves scattered on different crystals in the stack, this approach allows one to reconstruct the relative rotation, stretching, out-of-plane corrugation of the layers with atomic precision. Being holographic in nature, our approach allows…
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