Tutorial: Time-domain thermoreflectance (TDTR) for thermal property characterization of bulk and thin film materials
Puqing Jiang, Xin Qian, and Ronggui Yang

TL;DR
This tutorial provides an overview of the time-domain thermoreflectance (TDTR) technique, highlighting its fundamentals, recent advances, and applications in measuring thermal properties of bulk and thin film materials.
Contribution
It offers a comprehensive guide to TDTR, including configurations, variations, and future directions, enhancing understanding and application of this technique in thermal characterization.
Findings
TDTR is a reliable method for thermal property measurement.
Various TDTR configurations adapt to different measurement needs.
The tutorial discusses current limitations and future prospects of TDTR.
Abstract
Measuring thermal properties of materials is not only of fundamental importance in understanding the transport processes of energy carriers (electrons and phonons) but also of practical interest in developing novel materials with desired thermal conductivity for applications in energy, electronics, and photonic systems. Over the past two decades, ultrafast laser-based time-domain thermoreflectance (TDTR) has emerged and evolved as a reliable, powerful, and versatile technique to measure the thermal properties of a wide range of bulk and thin film materials and their interfaces. This tutorial discusses the basics as well as the recent advances of the TDTR technique and its applications in the thermal characterization of a variety of materials. The tutorial begins with the fundamentals of the TDTR technique, serving as a guideline for understanding the basic principles of this technique.…
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