Item Parameter Recovery for the Two-Parameter Testlet Model with Different Estimation Methods
Luo Yong

TL;DR
This study compares the effectiveness of MCMC, MMLE, and WLSMV estimation methods in recovering parameters of the 2PL testlet model, revealing no significant differences but highlighting convergence issues with limited-information methods under certain conditions.
Contribution
It provides a comprehensive simulation comparison of three estimation methods for the 2PL testlet model, including real data application, which was lacking in prior research.
Findings
No significant difference in parameter recovery among the three methods.
WLSMV and MCMC had convergence issues with small sample sizes and testlet effects.
MCMC remained stable regardless of sample size and testlet variance.
Abstract
The testlet model is a popular statistical approach widely used by researchers and practitioners to address local item dependence (LID), a violation of the local independence assumption in item response theory (IRT) which can cause various deleterious psychometric consequences. Same as other psychometric models, the utility of the testlet model relies heavily on accurate estimation of its model parameters. The two-parameter logistic (2PL) testlet model has only been systematically investigated in the psychometric literature regarding its model parameter recovery with one full information estimation methods, namely Markov chain Monte Carlo (MCMC) method, although there are other estimation methods available such as marginal maximum likelihood estimation (MMLE) and limited information estimation methods. In the current study, a comprehensive simulation study was conducted to investigate…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsPsychometric Methodologies and Testing · Advanced Statistical Modeling Techniques · Statistical Methods and Bayesian Inference
