Bilayer h-BN Barriers for Tunneling Contacts in Fully-Encapsulated Monolayer $\mathbf{MoSe_2}$ Field-Effect Transistors
Talieh S. Ghiasi, Jorge Quereda, Bart J. van Wees

TL;DR
This paper demonstrates that bilayer h-BN barriers at metal/monolayer MoSe2 interfaces significantly improve contact quality, preserve intrinsic properties, and enable efficient gating, advancing 2D semiconductor device performance.
Contribution
It introduces bilayer h-BN as an effective tunneling barrier for metal contacts in monolayer MoSe2 FETs, reducing contact resistance and maintaining high mobility.
Findings
Bilayer h-BN prevents chemical interactions at contacts.
Achieves near-intrinsic electron mobility (~26 cm²/Vs).
Enables efficient Fermi level tuning with small biases.
Abstract
The performance of electronic and spintronic devices based on two-dimensional semiconductors (2D SC) is largely dependent on the quality and resistance of the metal/SC electrical contacts, as well as preservation of the intrinsic properties of the SC channel. Direct Metal/SC interaction results in highly resistive contacts due to formation of large Schottky barriers and considerably affects the properties of the 2D SC. In this work, we address these two important issues in monolayer Field-Effect transistors (FETs). We encapsulate the channel with hexagonal Boron Nitride (h-BN), using bilayer h-BN at the metal/SC interface. The bilayer h-BN eliminates the metal/ chemical interactions, preserves the electrical properties of and reduces the contact resistances by prevention of Fermi-level pinning. We investigate…
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