Power Nano- and Picosecond Optoelectronic Switches Based on High-Voltage Silicon Structures with p-n Junctions III. Self-heating effects
A. S. Kyuregyan

TL;DR
This paper theoretically investigates self-heating effects in high-voltage silicon-based picosecond optoelectronic switches, revealing how temperature-dependent absorption influences maximum switching frequency and device stability.
Contribution
It provides the first theoretical analysis of self-heating effects in VPSS, highlighting the role of temperature-dependent absorption and electrothermal distribution in device performance.
Findings
Maximum switching frequency varies between 20-120 kHz for silicon-based devices.
Device temperature remains below 160°C under optimal conditions.
Direct-gap semiconductors are less suitable for high-frequency operation due to sharp absorption dependence.
Abstract
Self-heating effects of picosecond optoelectronic switches based on vertical high-voltage structures with p-n-junctions (VPSS) operating in a high-frequency mode were theoretically studied for the first time. It is shown that strong temperature dependence of the control radiation absorption coefficient is the main factor determining the maximum switching frequency and the corresponding maximum crystal temperature , as well as distributions of temperature and current density over a device area. A two-dimensional analysis of the simplest electrothermal model of VPSS embedded into a double coaxial forming line showed that an increase in the switching frequency leads to displacement of current to device periphery, where the temperature is minimal. However, distributions of and over the device area remain stable if and $T <…
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