Momentum-Transfer Model of Valence-Band Photoelectron Diffraction
G. Schoenhense, K. Medjanik, S. Babenkov, D. Vasilyev, M. Ellguth, O., Fedchenko, S. Chernov, B. Schoenhense, and H.-J. Elmers

TL;DR
This paper introduces a momentum-transfer model for valence-band photoelectron diffraction that accurately predicts interference patterns in angle-resolved X-ray photoemission, enhancing understanding of electronic structures without real-space localization assumptions.
Contribution
The novel model accounts for photon momentum transfer in k-space, providing a rigorous, assumption-free approach to valence-band photoelectron diffraction analysis.
Findings
Observed strong local intensity enhancements up to 5 times.
Predicted diffraction interference regions using a k-space Ewald-like construction.
Demonstrated the model's applicability to itinerant band states without localization assumptions.
Abstract
Owing to strongly enhanced bulk sensitivity, angle- or momentum-resolved photoemission using X-rays is an emergent powerful tool for electronic structure mapping. A novel full-field k-imaging method with time-of-flight energy detection allowed rapid recording of 4D (EB,k) data arrays (EB binding energy; k final-state electron momentum) in the photon-energy range of 400-1700eV. Arrays for the d-band complex of several transition metals (Mo, W, Re, Ir) reveal numerous spots of strong local intensity enhancement up to a factor of 5. The enhancement is confined to small (EB,k)-regions (dk down to 0.01 A-1; dEB down to 200 meV) and is a fingerprint of valence-band photoelectron diffraction. Regions of constructive interference in the (EB,k)-scheme can be predicted in a manner resembling the Ewald construction. A key factor is the transfer of photon momentum to the electron, which breaks the…
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Taxonomy
TopicsElectron and X-Ray Spectroscopy Techniques · X-ray Spectroscopy and Fluorescence Analysis · Crystallography and Radiation Phenomena
