Rupture of amorphous graphene via void formation
Sandeep K. Jain, Gerard T. Barkema

TL;DR
This study analyzes void formation in amorphous graphene, revealing how line tension and pressure influence critical void size, with implications for strain engineering in 2D materials.
Contribution
It provides a combined numerical and analytical model for void energetics in amorphous graphene, highlighting the role of shear modulus and finite size effects.
Findings
Critical radius of voids at 2 eV/Ų pressure: 3.48 Š(flat), 3.31 Š(buckled)
Finite size correction to line tension inversely proportional to void radius
Shear modulus sets the lower limit of line tension in amorphous 2D materials
Abstract
Apart from its unique and exciting electronic properties, many sensor based applications of graphene are purely based on its mechanical and structural properties. Here we report a numerical and analytical study of a void in amorphous (small domain polycrystalline) graphene, and show that the energetics of a void is a balance between the line tension cost versus the increased area gain. Using the concepts of classical nucleation theory, we show that the critical radius of a void formed in amorphous graphene at constant pressure is simply the ratio of line tension at the void and the applied pressure. The values of the critical radius of the void for flat and buckled graphene are 3.48\AA ~and 3.31\AA, respectively at 2 eV/\AA pressure. We also show that the dominant finite size correction to the line tension is inversely proportional to the radius of the void in both flat and…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
