TL;DR
This paper introduces a novel Monte Carlo ray tracing method to accurately calculate secondary electron emission from complex micro-architected surfaces, which are designed to reduce SEE in space thruster applications.
Contribution
It extends ray tracing Monte Carlo techniques to arbitrarily complex geometries using finite element meshes from tomography images, enabling realistic SEE predictions for micro-structured surfaces.
Findings
Micro-architected surfaces can reduce SEE by up to 50%.
The method accurately models secondary electron trajectories on complex geometries.
Porosity and primary electron energy influence SEE reduction effectiveness.
Abstract
Secondary electron emission (SEE) from inner linings of plasma chambers in electric thrusters for space propulsion can have a disruptive effect on device performance and efficiency. SEE is typically calculated using elastic and inelastic electron scattering theory by way of Monte Carlo simulations of independent electron trajectories. However, in practice the method can only be applied for ideally smooth surfaces and thin films, not representative of real material surfaces. Recently, micro-architected surfaces with nanometric features have been proposed to mitigate SEE and ion-induced erosion in plasma-exposed thruster linings. In this paper, we propose an approach for calculating secondary electron yields from surfaces with arbitrarily-complex geometries using an extension of the \emph{ray tracing} Monte Carlo (RTMC) technique. We study nanofoam structures with varying porosities as…
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