Continous every-single-shot carrier-envelope phase measurement and control at 100 kHz

TL;DR

This paper presents a high-speed, continuous method for measuring and controlling the carrier-envelope phase of ultrafast laser pulses at 100 kHz, enabling improved stabilization and CEP tagging for high-repetition-rate laser systems.

Contribution

It introduces a novel stereo above-threshold ionization time-of-flight spectrometer for real-time CEP measurement and control at 400 kHz, significantly advancing ultrafast laser diagnostics.

Findings

Achieved CEP measurement at 400 kHz repetition rate.

Demonstrated improved CEP stabilization in a 100 kHz OPCPA system.

Enabled CEP tagging for ultrafast laser pulses.

Abstract

With the emergence of high-repetition-rate few-cycle laser pulse amplifiers, aimed at investigating ultrafast dynamics in atomic, molecular and solid state science, the need for ever faster carrier-envelope phase (CEP) detection and control has arisen. Here we demonstrate a high speed, continuous, every-single-shot measurement and fast feedback scheme based on a stereo above-threshold ionization time-of-flight spectrometer capable of detecting the CEP and pulse duration at a repetition rate of up to 400 kHz. This scheme is applied to a 100 kHz optical parametric chirped pulse amplification (OPCPA) few-cycle laser system, demonstrating improved CEP stabilization and allowing for CEP tagging.