Design of a general scientific CCD simulation and test system

TL;DR

This paper presents a versatile CCD simulation and testing system capable of evaluating various CCD chips and their associated modules, including signal output, noise simulation, and performance verification.

Contribution

It introduces a comprehensive simulation and test system tailored for different CCD chips and modules, enhancing testing flexibility and accuracy.

Findings

Successfully tested on E2V CCD47-20 controller

Simulated CCD video signals with noise for performance verification

Validated system's ability to measure various module signals

Abstract

In this paper, we introduce a general scientific CCD simulation and test system which can meet the test requirements of different types of CCD chips from E2V company, such as measuring different signals output from modules of a CCD controller including power supply, fan, temperature control module, crystal oscillator, shutter and clock-bias generator. Furthermore, the video signal of the CCD detector can be simulated and superimposed with random noise to verify the performance of the video sampling circuit of the CCD controller. The simulation and test system was successful used for the CCD controller which was designed for E2V CCD47-20 detector.