Measurement of the $^{20}$F half-life

TL;DR

This paper reports a new measurement of the $^{20}$F half-life using a novel experimental setup, finding a value significantly different from previous precise measurements and highlighting the need for further investigation.

Contribution

The study provides a new half-life measurement of $^{20}$F with a different systematic approach, revealing discrepancies with prior results and emphasizing the necessity for additional measurements.

Findings

Measured $^{20}$F half-life as 11.0011 seconds

Result differs by 17 standard deviations from previous precise measurements

Highlights inconsistency in existing $^{20}$F half-life data

Abstract

The half-life of the $^{20}$F ground state has been measured using a radioactive beam implanted in a plastic scintillator and recording $\beta\gamma$ coincidences together with four CsI(Na) detectors. The result, $T_{1/2} = 11.0011(69)_{\rm stat}(30)_{\rm sys}$~s, is at variance by 17 combined standard deviations with the two most precise results. The present value revives the poor consistency of results for this half-life and calls for a new measurement, with a technique having different sources of systematic effects, to clarify the discrepancy.