MicroMegascope
Luca Canale, Axel Laborieux, Agasthya Aroul Mogane, Laetitia Jubin,, Jean Comtet, Antoine Lain\'e, Lyd\'eric Bocquet, Alessandro Siria, Antoine, Nigu\`es

TL;DR
This paper demonstrates atomic force microscopy using a large, centimeter-scale oscillator, enabling nanometric surface imaging with a more accessible and versatile setup compared to traditional microscopic oscillators.
Contribution
It introduces the first atomic force imaging with a macroscopic, grams-scale oscillator, expanding AFM applications and simplifying fabrication and usage.
Findings
Nanometric resolution achieved with a centimeter-sized oscillator
Successful imaging in air and liquid environments
High sensitivity demonstrated with a grams-scale tuning fork
Abstract
Atomic Force Microscopy (AFM) allows to reconstruct the topography of surface with a resolution in the nanometer range. The exceptional resolution attainable with the AFM makes this instrument a key tool in nanoscience and technology. The core of the set-up relies on the detection of the mechanical properties of a micro-oscillator when approached to a sample to image. Despite the fact that AFM is nowadays a very common instrument for research and development applications, thanks to the exceptional performances and the relative simplicity to use it, the fabrication of the micrometric scale mechanical oscillator is still a very complicated and expensive task requiring a dedicated platform. Being able to perform atomic force microscopy with a macroscopic oscillator would make the instrument more versatile and accessible for an even larger spectrum of applications and audiences. We present…
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