RF-PUF: Enhancing IoT Security through Authentication of Wireless Nodes using In-situ Machine Learning
Baibhab Chatterjee, Debayan Das, Shovan Maity, Shreyas Sen

TL;DR
RF-PUF leverages inherent RF signal variations and deep learning to authenticate wireless IoT devices in real-time, enhancing security without extra hardware or preambles.
Contribution
This work introduces a neural network-based RF-PUF framework that uses in-situ RF property variations for device authentication, eliminating the need for additional circuitry.
Findings
Achieves 99.9% accuracy in distinguishing up to 4800 transmitters.
Operates effectively without traditional preambles.
Maintains high accuracy (~99%) for 10,000 transmitters under varying conditions.
Abstract
Traditional authentication in radio-frequency (RF) systems enable secure data communication within a network through techniques such as digital signatures and hash-based message authentication codes (HMAC), which suffer from key recovery attacks. State-of-the-art IoT networks such as Nest also use Open Authentication (OAuth 2.0) protocols that are vulnerable to cross-site-recovery forgery (CSRF), which shows that these techniques may not prevent an adversary from copying or modeling the secret IDs or encryption keys using invasive, side channel, learning or software attacks. Physical unclonable functions (PUF), on the other hand, can exploit manufacturing process variations to uniquely identify silicon chips which makes a PUF-based system extremely robust and secure at low cost, as it is practically impossible to replicate the same silicon characteristics across dies. Taking inspiration…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsPhysical Unclonable Functions (PUFs) and Hardware Security · Integrated Circuits and Semiconductor Failure Analysis · Neuroscience and Neural Engineering
