Transverse Kerker Scattering for Angstrom Localization of Nanoparticles

TL;DR

This paper introduces an all-optical method using transverse Kerker scattering to achieve sub-Angstrom localization precision of nanoparticles, enabling ultra-precise nanometrology and biophysical measurements.

Contribution

The authors demonstrate a novel all-optical technique that resolves nanoparticle displacements down to 3 Angstroms with 0.6 Angstrom precision, surpassing previous localization methods.

Findings

Displacement resolution of 3 Angstroms achieved

Localization precision of 0.6 Angstrom demonstrated

Method applicable for advanced nanometrology

Abstract

Angstrom precision localization of a single nanoantenna is a crucial step towards advanced nanometrology, medicine and biophysics. Here, we show that single nanoantenna displacements down to few Angstroms can be resolved with sub-Angstrom precision using an all-optical method. We utilize the tranverse Kerker scattering scheme where a carefully structured light beam excites a combination of multipolar modes inside a dielectric nanoantenna, which then upon interference, scatters directionally into the far-field. We spectrally tune our scheme such that it is most sensitive to the change in directional scattering per nanoantenna displacement. Finally, we experimentally show that antenna displacement down to 3 Angstrom is resolvable with a localization precision of 0.6 Angstrom.